
The durability of even the most modern electronic devices (EEW) is inferior to semiconductor counterparts. In most cases this is due to the emissivity of the cathode. The matter is further complicated by the fact that the diagnostic tool (commercially available instruments for measurement and control of emission current) is, unfortunately, very expensive, difficult to operate, as they contain a “naughty” anode and grid rectifiers, which are designed to create to check the lamp mode is close to the working. The received data are plotted, calculated certain characteristics, and by means of which required parameters.
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